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Hot Carrier Degradation in Semiconductor Devices

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Hot Carrier Degradation in Semiconductor Devices
$109.99

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About this product

This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy ("become hot"), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.



Author: Tibor Grasser
ISBN-10: 3319089935
ISBN-13: 9783319089935
Publisher: Springer
Language: English
Published: 11/27/2014
Pages: 517
Format: Hardcover
Weight: 2.01lbs
Size: 9.21h x 6.14w x 1.13d

Description supplied by WR Book House through its current Shopify listing. Product, performance, and health claims are the seller’s and have not been independently verified by StorkScout.